Array structure of two-transistor cells with merged floating...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185020, C365S185230

Reexamination Certificate

active

07072215

ABSTRACT:
Variations in memory array and cell configuration are shown, which eliminate punch-through disturb, reverse-tunnel. Several configurations are shown which range from combined and separate source lines for each row of cells, a two transistor cell containing a read transistor and a program transistor connected by a merged floating gate, and a two transistor cell where the program transistor has an extra implant to raise the Vt of the transistor to protect against punch-through disturb. A method is also described to rewrite disturbed cells, which were not selected to be programmed.

REFERENCES:
patent: 5033023 (1991-07-01), Hsia et al.
patent: 5544103 (1996-08-01), Lambertson
patent: 5812452 (1998-09-01), Hoang
patent: 5909387 (1999-06-01), Wong et al.
patent: 6088269 (2000-07-01), Lambertson
patent: 6121087 (2000-09-01), Mann et al.
patent: 6128220 (2000-10-01), Banyai et al.
patent: 6376876 (2002-04-01), Shin et al.
patent: 6377498 (2002-04-01), Kang
patent: 6400603 (2002-06-01), Blyth et al.
patent: 6781187 (2004-08-01), Owa
patent: 6888755 (2005-05-01), Harari
patent: 2002/0171102 (2002-11-01), Shizukuishi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Array structure of two-transistor cells with merged floating... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Array structure of two-transistor cells with merged floating..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Array structure of two-transistor cells with merged floating... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3524347

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.