Array structure for use in an adaptive inference testing device

Details Array structure for use in an adaptive inference testing device Array structure for use in an adaptive inference testing device

1989-11-07

1991-09-03

Dixon, Joseph L.

Boots, shoes, and leggings

364513, 371 26, 371 221, G05B 1902, G01R 3128

Patent

active

050460340

ABSTRACT:
An adaptive inference system for testing electrical or electronic devices or assemblies. A mechanism is provided for performing position-dependent, time-ordered tests upon electrical or electronic devices in order to obtain a test data array. A mechanism is also provided to define a reference array containing acceptable data for comparison with test data. A comparator is connected to the test data array and to the reference array for providing an error array. An error array library is also provided, which contains accumulated error data. Finally, an error array comparator is connected between the error array library and the error array providing a diagnostic analysis of the electrical or electronic devices or assemblies.

REFERENCES:
patent: 4503536 (1985-03-01), Panzer
patent: 4559626 (1985-12-01), Brown
patent: 4802231 (1989-01-01), Davis
patent: 4815077 (1989-03-01), Boenning
patent: 4839823 (1989-06-01), Matsumoto
patent: 4841456 (1989-06-01), Hogan, Jr. et al.
patent: 4847795 (1989-07-01), Baker et al.

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