Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-05-27
2008-05-27
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S661000, C324S686000
Reexamination Certificate
active
07378856
ABSTRACT:
Circuits and methods for detecting and amplifying sensor and sensor array (102, 104) output signals are presented. According to some aspects, a nonlinear feedback loop containing a sensor element provides a nonlinear transformation that compensates for a corresponding nonlinear response of the sensor element thereby providing a linearized final output signal. In other aspects, idle sensors are coupled to a reference on non-idle sensor elements. Other aspects include sensor and amplification circuits which operate without traditional filtering or switching elements, such that a higher throughput is achieved and no settling time is required due to traditional transients, thus allowing for faster scanning of larger sensor arrays. Some embodiments of the present invention are directed to variable gap capacitive sensor arrays and the signal processing electronics.
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Peine William
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Son Jae S.
He Amy
Hirshfeld Andrew H.
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