Array detectors for simultaneous measurement of ions in mass spe

Details Array detectors for simultaneous measurement of ions in mass spe Array detectors for simultaneous measurement of ions in mass spe

1996-02-09

1998-09-01

Anderson, Bruce

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250282, 250283, H01J 4900, B01D 5944

Patent

active

058013806

ABSTRACT:
Improvements for viewing particles, e.g. electrons or ions, in mass spectrometer systems. A special kind of system allows a phosphor to be formed which does not include any kind of conductive layer thereon. The particles impinge directly on the phosphor, and produce light that shines through an ITO layer. This special system enables lower voltage, and smaller systems. Another improvement enables direct viewing of ions from the system.

REFERENCES:
patent: 3868507 (1975-02-01), Panitz
patent: 3955084 (1976-05-01), Giffin
patent: 4785172 (1988-11-01), Kubena et al.
patent: 5463218 (1995-10-01), Holle
patent: 5528099 (1996-06-01), Xie

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