Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-19
2006-09-19
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
07109737
ABSTRACT:
Arrangements having integrated circuit (IC) voltage and thermal resistance designated on a per IC basis.
REFERENCES:
patent: 4875002 (1989-10-01), Sakamoto et al.
patent: 5384531 (1995-01-01), Yamazaki et al.
patent: 5583875 (1996-12-01), Weiss
patent: 5734274 (1998-03-01), Gavish
patent: 5793945 (1998-08-01), Tabata et al.
patent: 5923602 (1999-07-01), Statovici et al.
patent: 5973541 (1999-10-01), Rajivan et al.
patent: 6112940 (2000-09-01), Canella
patent: 6128757 (2000-10-01), Yousuf et al.
patent: 6134685 (2000-10-01), Spano
patent: 6360333 (2002-03-01), Jansen et al.
patent: 6430705 (2002-08-01), Wisor et al.
patent: 6472899 (2002-10-01), Osburn et al.
patent: 6625758 (2003-09-01), Singh
patent: 2002/0084798 (2002-07-01), Osburn et al.
patent: 0 407 029 (1991-01-01), None
patent: 0 715 176 (1996-06-01), None
PCT Notification of Transmittal of The International Search Report or The Declaration for PCT Counterpart Application No. PCT/US03/33085 Containing International Search Report (Mar. 8, 2004).
Arabi Tawfik
Iovino Gregory M.
Kornfeld Avner
Ma Hung-Piao
Rotem Shai
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Nguyen Vinh P.
LandOfFree
Arrangements having IC voltage and thermal resistance... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Arrangements having IC voltage and thermal resistance..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arrangements having IC voltage and thermal resistance... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3581828