Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For high frequency device
Patent
1998-09-17
2000-05-30
Saadat, Mahshid
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
For high frequency device
257583, 257592, 257565, H01L 27082, H01L 27102, H01L 2970
Patent
active
060694041
ABSTRACT:
A structure for a microwave device in which the minimum noise figure is reduced in that underneath the base terminal surface of a transistor, a highly-doped trenched layer is formed, which layer is connected to a reference potential in the vicinity of the base terminal surface via a standard collector contact.
REFERENCES:
patent: 5557139 (1996-09-01), Palara
Itoh et al. ("The analysis of silicon bipolar transistor scaling-down scheme for low noise and low power analog application", Bipolar/BiCMOS Circuits and Technology Meeting, 1994, Proceedings of the 1994, 1994, pp. 60-63).
N. Camilleri, et al., IEEE 1994 Microwave and Millimeter-Wave Monolithic Circuits Symposium, Bonding Pad Models for Silicon VLSI Technologies and Their Effects on the Noise Figure of RF NPNs, WEeF-66, pp. 225-228.
M.J. Deen, et al., Canadian Journal of Physics, Modelling of Bonding Pads and Their Effect on the High Frequency Noise Figure of Polysilicon Emitter Bipolar Junction Transistors, In Press 1996.
Aufinger Klaus
Knapp Herbert
Clark Jhihan B.
Saadat Mahshid
Siemens Aktiengesellschaft
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