Arrangement for testing the operability of a semiconductive devi

Details Arrangement for testing the operability of a semiconductive devi Arrangement for testing the operability of a semiconductive devi

1982-11-08

1985-11-19

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

340516, 340645, G01R 3126, G08B 2100

Patent

active

045545073

ABSTRACT:
An arrangement for checking the integrity and operability of a semiconductive device including a control circuit for injecting test signals into a normal control signal to induce a momentary change of the operating condition of the semiconductive device, a sensing circuit connected in parallel with the semiconductive device sensitive to an induced change to produce an output indicating the induced change, and a correlation circuit operative to correlate the test pulses with the sensed response which is arranged to carry out predetermined action in the event that the correlation circuit determines a state of inoperability of the semiconductive device.

REFERENCES:
patent: 3238520 (1966-03-01), Van Vlodrop
patent: 3648233 (1972-03-01), Clark
patent: 4025845 (1977-05-01), Lhommelet et al.
patent: 4415844 (1983-11-01), Delin et al.

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