Arrangement for testing micro interconnections and a method for

Details Arrangement for testing micro interconnections and a method for Arrangement for testing micro interconnections and a method for

1983-06-16

1986-05-06

Krawczewicz, Stanley T.

Electricity: measuring and testing

Plural, automatically sequential tests

324 51, G01R 1512

Patent

active

045874816

ABSTRACT:
An arrangement for electrically testing microinterconnections with electric test contacts may be used given drastically-reduced dimensions of electric conductors and of the grid dimensions in printed circuitboards. The electric test contacts are selectable by way of internal switches. The test contacts can be disposed in a matrix whose grid dimension corresponds to the grid dimension of a printed circuitboard to be tested.

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P. H. Smith, Automatic Testing of Leakage Current Monitor for Bipolar Integrated Circuit, IBM Technical Disclosure Bulletin, Nov. 1975, pp. 1935, 1936.

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