Arrangement for testing a watchdog circuit

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

371 3, 371 62, 39518505, 3642679, 364270, 3642645, G06F 1100

Patent

active

055220401

ABSTRACT:
The invention relates to an arrangement for testing a watchdog circuit wherein the pulses of a microcomputer to be monitored by the watchdog circuit are incrementally lengthened until the watchdog circuit responds and emits a corresponding reset signal to the microcomputer. The operational test of the watchdog circuit is repeated after each cold start of the microcomputer. This arrangement is especially suited for systems relevant to safety wherein the functional reliability of the individual components such as microcomputer and actuating elements are to be monitored.

REFERENCES:
patent: 4562550 (1985-12-01), Beatty et al.
patent: 4574355 (1986-03-01), Beatty et al.
patent: 4586179 (1986-04-01), Sirazi et al.
patent: 4860289 (1989-08-01), Coulson
patent: 4879647 (1989-11-01), Yazawa
patent: 4956842 (1990-09-01), Said
patent: 5014190 (1991-05-01), Johnson
patent: 5041827 (1991-08-01), Kirstein
patent: 5068853 (1991-11-01), Soma et al.
patent: 5073853 (1991-12-01), Johnson
patent: 5303390 (1994-04-01), Little
patent: 5341497 (1994-08-01), Younger

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Arrangement for testing a watchdog circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Arrangement for testing a watchdog circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arrangement for testing a watchdog circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-794483

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.