Arrangement for spectrally sensitive reflected-light and...

Details Arrangement for spectrally sensitive reflected-light and... Arrangement for spectrally sensitive reflected-light and...

2006-07-11

2006-07-11

Dunn, Drew A. (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C359S368000

Reexamination Certificate

active

07075716

ABSTRACT:
The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.

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