Arrangement for measuring the position of an index

Details Arrangement for measuring the position of an index Arrangement for measuring the position of an index

1980-09-30

1982-10-26

Punter, William H.

Optics: measuring and testing

By polarized light examination

With light attenuation

250231SE, 356150, G01B 1114, G01C 102, G01C 106, G01D 536

Patent

active

043559018

ABSTRACT:
The invention relates to an arrangement for measuring the position of an index of a surveying device comprising a flat-plate micrometer and at least one swinging index. The interfering oscillations, due to external influences, of the index in the course of a repeated measurement of a graduated circle interval are compensated by balancing the measuring frequency and the interfering oscillation frequency. The frequency of the interfering index oscillations is detected by photodetectors, and compared to the rotation speed of a servo-motor for initiating the frequency of the repeated index measurement both frequencies being adapted to one another via the rotational speed controlled by a frequency controlled unit.

REFERENCES:
patent: 2837956 (1958-06-01), Schneider
patent: 3068741 (1962-12-01), Werner
patent: 3154626 (1964-10-01), Sisson
patent: 4136955 (1979-01-01), Aeschlimann et al.

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