Measuring and testing – Liquid level or depth gauge
Reexamination Certificate
2005-01-18
2005-01-18
Williams, Hezron (Department: 2856)
Measuring and testing
Liquid level or depth gauge
C340S621000
Reexamination Certificate
active
06843124
ABSTRACT:
A continuous measurement of the level of contents in a container is effected by a level measuring device functionong in accordance with the transit time principle by means of waves transmitted from a position located above the highest possible contents level onto the surface of the material in the container. A measuring circuit determines the contents level from the transit time of the useful echo reflected from the material surface. In addition, one or more limit sensors are located at the container, each of which furnishes a signal indicating whether the contents level is above or below a level to be monitored by the limit sensor and which is situated between the minimum and maximum contents levels of the container. The measuring circuit receives the output signals of all limit sensors and uses these output signals to check and eventually to correct the contents level measured value determined by the level measuring device. In particular, the measuring result furnished by the level measuring device can be compared with an exact contents level value every time the contents level reaches the level monitored by a limit sensor whereby the level indication of the limit sensor changes its status. In certain cases, a single limit sensor is sufficient for this purpose, which monitors a contents level which is regularly exceeded or undershot in the normal use of the container.
REFERENCES:
patent: 5233352 (1993-08-01), Cournane
patent: 5609059 (1997-03-01), McEwan
patent: 5672975 (1997-09-01), Kielb et al.
patent: 5847567 (1998-12-01), Kielb et al.
patent: 6539794 (2003-04-01), Otto et al.
Hugo Lang and Wolfgang Lubcke, “Smart Transmitter Using Microwave Pulses to Measure the Level of Liquids and Solids in Process Applications”, 1993, pp. 731-742, (month unavailable).*
Popular Science, “Radar on a Chip”, Mar. 1995, pp. 3, 107-110, 116 and 117.*
“Control Devices and Systems”, Control Engineering, Jul. 1984, p. 68.*
*-Note: These References were Provided to the Examiner by the Applicant in the Parent to this Application and Therefore the Applicant has Copies of These Documents and thus They are not Provided to the Appicant Hwith this Office Action.
Lubcke Wolfgang
Otto Johanngeorg
Bacon & Thomas
Endress & Hauser GmbH & Co. KG
Frank Rodney
Williams Hezron
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