Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1983-12-29
1986-12-16
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
046293248
ABSTRACT:
A pattern of light is projected upon a surface to be measured which may be devoid of surface detail. A sharply focused image of the surface provides distance discrimination. Although the projected pattern may be separate from the imaging optics, a common optics path removes distortion, provides maximum sensitivity and eliminates processing for misalignment between projector and imager. Sequential cross-correlation, synchronous detection or percent modulation processing methods may be readily implemented to develop three-dimensional co-ordinates relative to the sensor for all in-focus regions of the image. Refocusing the lens provides depth coverage.
REFERENCES:
patent: 3481672 (1969-12-01), Zoot
patent: 4153834 (1979-05-01), Hayamizu
patent: 4209252 (1980-06-01), Arditty et al.
patent: 4320462 (1982-03-01), Lund et al.
Fogiel Max
Robotic Vision Systems Inc.
Rosenberger R. A.
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