Arrangement for exchanging measuring and/or sampling probes

Details Arrangement for exchanging measuring and/or sampling probes Arrangement for exchanging measuring and/or sampling probes

1983-12-01

1985-08-27

Swisher, S. Clement

Measuring and testing

Miscellaneous

7386431, 266 99, 374140, 901 6, F27D 2100, G01N 3320

Patent

active

045370729

ABSTRACT:
There is disclosed an arrangement for exchanging measuring and/or sampling probes capable of being slipped on to a holding means arranged on the lower end of a vertically movable lance with friction-tight contact. It includes a grab clamping the probe and movable from an operation position below the lance into a position laterally therebeside. In order to be able to slip on a probe to a holding means assuming a position that deviates from the ideal position, without damage to the holding means and the probes, the grab is mounted on the arrangement by universal joint means.

REFERENCES:
patent: 3948093 (1976-04-01), Folchi et al.
patent: 4239189 (1980-12-01), Scherff

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