Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1997-09-05
2000-06-06
Wachsman, Hal
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702 64, 702116, 324691, G01R 2700
Patent
active
060730838
ABSTRACT:
The invention is directed to an arrangement for determining the internal resistance of a lambda probe having a positive pole and an internal resistance. A computer includes at least one computer port having a switchable state, a signal input and fixed pregiven values. A supply voltage source having a positive pole and a measurement resistor are also provided. The positive pole of the supply voltage source is connected to the positive pole of the lambda probe via the computer port and the measurement resistor. An analog/digital converter is connected forward of the signal input and the positive pole of the lambda probe is connected directly to the analog/digital converter for applying variable values to the signal input via the analog/digital converter. The computer is adapted to compute the internal resistance of the lambda probe from the variable values applied to the signal input and the fixed pregiven values. A method of determining the internal resistance of a lambda probe is also disclosed.
REFERENCES:
patent: 5140535 (1992-08-01), Raff et al.
patent: 5224345 (1993-07-01), Schnaibel et al.
patent: 5291417 (1994-03-01), Schnaibel et al.
patent: 5375415 (1994-12-01), Hamburg et al.
patent: 5392643 (1995-02-01), O'Kennedy et al.
patent: 5692487 (1997-12-01), Schuerz et al.
Junginger Erich
Raff Lothar
Schnaibel Eberhard
Ottesen Walter
Robert & Bosch GmbH
Wachsman Hal
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