Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-04-12
2011-04-12
He, Amy (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07924027
ABSTRACT:
An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting the sample is located or into which it can be brought. The sample and/or the slide causing a measurable change in the capacitance of the sensor. From the change in the capacitance of the sensor, the distance of the sample and/or of the microscope slide from the sensor is determined, and thus the distance of the sample from the objective. A capacitive distance sensor can be applied in such an arrangement by which a stray field can be generated between at least two electrodes. The capacitance experiences a measurable change owing to an object introduced into the stray field. The electrodes of the sensor are arranged as substantially coaxial lateral surfaces. The electrodes are designed such that the sensor can be plugged onto the objective of the microscope, the lateral surfaces at least partially enclosing and touching the objective.
REFERENCES:
patent: 6534973 (2003-03-01), Spoerl et al.
patent: 6801650 (2004-10-01), Kikuchi et al.
patent: 2002/0067477 (2002-06-01), Morita et al.
patent: 2004/0169915 (2004-09-01), Yoneyama et al.
patent: 27 11 925 (1977-09-01), None
patent: 197 33 297 (1999-02-01), None
patent: 199 11 958 (2000-10-01), None
patent: 100 59 232 (2002-06-01), None
patent: 102 44 619 (2004-04-01), None
German Office Action dated Aug. 28, 2007 including English translation of the relevant portion (Six (6) pages).
German Office Action dated Sep. 17, 2008 (2 pages).
Rygiel Reiner
Sieckmann Frank
Crowell & Moring LLP
He Amy
Leica Microsytems CMS GmbH
LandOfFree
Arrangement for determining the distance, capacitive... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Arrangement for determining the distance, capacitive..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arrangement for determining the distance, capacitive... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2652463