Arrangement for determining on approximation the equivalent circ

Details Arrangement for determining on approximation the equivalent circ Arrangement for determining on approximation the equivalent circ

1991-08-20

1992-06-09

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

324638, 324650, 36457105, 364802, G01R 2728

Patent

active

051210630

ABSTRACT:
An arrangement for determining on approximation the equivalent circuit diagram of an electrical or electronic element at high frequencies includes a measuring apparatus (4), to which the element to be represented as a two-port element (59) or a one-port element (1) is connected through connection members (2; 57, 58, 60) and which measures over a preselected frequency range the parameters of the stray matrix of the two-port element of the impedance or the reflection factor of the one-port element with the connection members. To the measuring apparatus (4) is connected an evaluation circuit (7), which corrects the measurement result by inclusion of two-port parameters of the connection member(s) determined before the measurement and which calculates for a preselected equivalent circuit diagram of the element from the corrected measurement result values of the equivalent circuit diagram elements by means of an optimization strategy.

REFERENCES:
patent: 3044703 (1962-07-01), Paynter
patent: 3500184 (1970-03-01), Ho
patent: 3775603 (1973-11-01), Ainsworth
patent: 4342089 (1982-07-01), Hall
patent: 4816767 (1989-03-01), Cannon
patent: 4835726 (1989-05-01), Lewis
patent: 4858160 (1989-08-01), Strid
Rhytting: "An Analysis of Vector Measurement Accuracy Enhancement Techniques"--RF & .mu.W Symposium--Mar. 1982.
IEEE Transactions on Microwave Theory and Techniques, Band MTT-30, J. C. Tippet et al, 1982, "A Rigorous Technique for Measuring the Scattering Matrix . . . ".
Microwave Journal, Band 24, Nr. 4, Apr. 1981, G. R. Cobb: "New Software for Low Loss Two-Part Measurements".

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