Arrangement and method for the identification of substrates

Details Arrangement and method for the identification of substrates Arrangement and method for the identification of substrates

2005-01-18

2005-01-18

Bali, Vikkram (Department: 2623)

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Applications

Manufacturing or product inspection

C382S149000, C382S147000

Reexamination Certificate

active

06845174

ABSTRACT:
An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprisinga turntable (2) for rotating a substrate (S) placed thereon;an illumination source (4) and a receiving device (5) for evaluating the intensity of the light emerging from the illumination source (4), the edge zone of the substrate (S) placed on the turntable (2), upon rotation thereof, influencing the light intensity striking the receiving device (5);a device (6) for reading the identification marking (I), having a sensing region (E); anda calculation device that calculates a manipulated variable for a correction rotation angle about the rotation axis (A) for alignment of the identification marking (I) with respect to the sensing region (E), and a manipulated variable for a correction motion for changing the position of the sensing region (E) with respect to the rotation axis (A) or with respect to the actual position of the identification marking (I), and outputs them to a positioning device.A corresponding identification method is also described.

REFERENCES:
patent: 4007988 (1977-02-01), Bromfield et al.
patent: 4723221 (1988-02-01), Matsuura et al.
patent: 5238354 (1993-08-01), Volovich
patent: 5870488 (1999-02-01), Rush et al.
patent: 20010014170 (2001-08-01), Willems van Dijk et al.

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