Arrangement and method for testing a capacitance array in an...

Details Arrangement and method for testing a capacitance array in an... Arrangement and method for testing a capacitance array in an...

2008-06-10

2008-06-10

Hirshfeld, Andrew H (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S678000

Reexamination Certificate

active

07385404

ABSTRACT:
An arrangement for testing a plurality of capacitances in a capacitance array of an integrated circuit includes a power supply and a means for cyclically charging and discharging at least one of the capacitances. In this arrangement, the cycle frequency is dependent on the value of the capacitance. The cycle frequency or a quantity characteristic associated therewith is measured by a means to ascertain a value of the capacitance under test.

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patent: 7145350 (2006-12-01), Mellert et al.
patent: 2005/0270042 (2005-12-01), Doljack
patent: 43 40 472 (1995-04-01), None

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