Arrangement and method for focusing a multiplane image...

Optics: measuring and testing – Plural test

Reexamination Certificate

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C348S087000

Reexamination Certificate

active

08072586

ABSTRACT:
A focused multi-planar image acquisition in real time even while a test object is moving, is achieved with a system and a method for a focused multi-planar image acquisition in a prober. When a surface of a test object is positioned laterally in relation to tips of separated probe needles, a microscope is focused on the surface of the test object at a first time and on a plane of the probe needles at a second time. The objective lens is provided with a microscope objective lens focusing system, which can focus the objective lens, independently of a vertical adjustment drive of the microscope, on the surface of the test object in a first focal plane and in a second focal plane, which is on a level with the probe needle tips.

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patent: 6096567 (2000-08-01), Kaplan et al.
patent: 2006/0184041 (2006-08-01), Andrews et al.
patent: 2008/0158664 (2008-07-01), Teich et al.

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