Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-03-06
2007-03-06
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
11237353
ABSTRACT:
An area-change sensing through capacitive techniques is disclosed. In one embodiment, a first conductive surface is substantially parallel to a second conductive surface. The first conductive surface may be moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface. A processing module may detect an overlap area between the first conductive surface and the second conductive surface. In addition, a reference surface may be substantially parallel to the first conductive surface and the second conductive surface. The processing module may be configured to measure a reference capacitance between the reference surface and a selected surface of the first conductive surface and the second conductive surface. The processing module may apply an algorithm that considers the reference capacitance and converts a change in capacitance between the first conductive surface and the second conductive surface to at least one of a voltage response and a frequency response to determine the measurement.
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Dallenbach William D.
Harish Divyasimha
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