Electrical connectors – With flaccid conductor and with additional connector spaced... – And with third connector spaced therealong
Reexamination Certificate
2008-04-08
2008-04-08
Leon, Edwin A. (Department: 2833)
Electrical connectors
With flaccid conductor and with additional connector spaced...
And with third connector spaced therealong
C439S066000
Reexamination Certificate
active
11152651
ABSTRACT:
Methods and systems are provided for testing circuits having electronic devices. In one embodiment, an electronic device test adapter comprises a base interface section, at least one test interface section, and at least one flexible section. The base interface section includes a device side attach pad interface and a printed wiring assembly side attach pad interface. The base interface section is adapted to mount onto a printed wiring assembly device. The device side attach pad interface and the printed wiring assembly side attach pad interface are adapted to communicate one or more signals between the electronic device and the printed wiring assembly device. The at least one test interface section includes a testing interface, wherein the base interface section, the at least one flexible section, and the at least one test interface section are adapted to communicate the one or more signals communicated between the electronic device and the printed wiring assembly device to the testing interface.
REFERENCES:
patent: 5415560 (1995-05-01), Balyasny
patent: 5477160 (1995-12-01), Love
patent: 5642055 (1997-06-01), Difrancesco
patent: 5896037 (1999-04-01), Kudla et al.
patent: 6005403 (1999-12-01), Webster et al.
patent: 6965244 (2005-11-01), Miller
Fogg & Powers LLC
Honeywell International , Inc.
Leon Edwin A.
LandOfFree
Area array device test adapter does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Area array device test adapter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Area array device test adapter will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3905894