Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1997-03-26
1998-11-17
Trammell, James P.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
361 42, 324536, G01R 3108
Patent
active
058390928
ABSTRACT:
A system for detecting arcing faults in a line conductor carrying an electrical current between a power source and a load, the electrical current defining an AC waveform comprising a series of alternating positive half cycles and negative half cycles. In one embodiment, the method comprises the steps of obtaining current samples in a series of half cycles of the waveform, determining the peak current of each of the half cycles, and comparing the peak currents to determine changes in slope between half cycles. The number of changes in slope occurring within a selected time interval are counted and an arc indicative signal is produced when the number of reversals in polarity in slope occurring within the selected time interval equals or exceeds a predetermined threshold number. In another embodiment, the method comprises, in addition to the steps above, the steps of normalizing each of the current samples and autocorrelating the normalized current samples to obtain a measure of significant waveform shape changes between consecutive half cycles. Both the number of changes in slope and the number of significant waveform shape changes occurring within a selected time interval are counted and an arc indicative signal is produced when the number of reversals in polarity or the number of waveform changes equal or exceed predetermined threshold values.
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Bettis Charles D.
Erger Robert J.
Wong Kon B.
Golden Larry I.
Irfan Kareem M.
Smithers Matthew
Square D Company
Trammell James P.
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