Architecture and package orientation for high speed memory...

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Reexamination Certificate

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C365S063000, C257S678000

Reexamination Certificate

active

06353549

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to semiconductor memory devices, and in particular, the invention relates to an architecture and package orientation for semiconductor memory devices.
BACKGROUND OF THE INVENTION
Various arrangements have been proposed for increasing the speed of memory devices requiring high speed data throughput such as synchronous dynamic random access memory (SDRAM). Most of these arrangements have been directed to minimizing the access time for accessing the memory array. These arrangements include development of faster operating modes, such as extended data output mode, burst write and read modes, etc., and the use of pipelining arrangements. At the present time for example, the standard high Speed for known SDRAM devices is about 100 MHZ.
Although many exsisting memory devices provide fast operation, the extent to which speed can be increased is limited by the architecture and packaging of the memory device. For example, SDRAM devices are housed in packages that have an industry-standard pin layout and are of specified lengths and widths. Typically, SDRAM devices are contained in small outline-J lead (SOJ) packages. For a dual 1 Meg×4 SDRAM device, the width of the SOJ package is about 300 mils and the width of the thin, small outline package (TSOP) is about 400 mils. To make the chip on which the memory device is fabricated fit in such standard package, semiconductor manufactures orient the chip lengthwise within the package.
FIG. 1
, which is labeled Prior Art, is a representation of the chip layout for a known dual bank SDRAM device
100
fabricated on a memory chip
102
. The SDRAM device includes a bank
0
memory array
104
which extends along one side of the memory chip and a bank
1
memory array
106
which extends along the opposite side of the memory chip. Each memory array, such as memory array
104
, includes a plurality of sub-arrays
105
having access circuitry including row decoder circuits, column decoder circuits and sense amplifier circuits. The row decoder circuits include row decoder circuits
107
which extend along the side
108
of the memory sub-arrays, row decoder circuits
109
which extend along the opposite side
110
of the sub-arrays, and row decoder circuits
111
which are located between the sub-arrays. The column decoder circuits
112
extend along one end
114
of the memory array near the one edge
116
of the memory chip
102
. The sense amplifier circuits
118
are located between each of the sub-arrays of the memory array. Column select lines, such as column select lines
120
represented by dashed lines, extend through the memory array
104
om the column decoder circuits
112
at end
114
of the memory array
104
near edge
116
of the memory chip to the opposite end
122
of the memory array near the opposite edge
124
of the memory chip.
The data output register
128
is located adjacent to the edge
124
of the memory chip so as to be adjacent to the chip bond pads as is conventional. The memory chip includes a first plurality of chip bond pads
130
which are located along edge
116
of the memory chip and which provide connections to address inputs for the memory chip. A second plurality of chip bond pads
132
, which are located along the opposite edge
124
of the memory chip, provide connections to data inputs/outputs for the memory chip. The memory further includes clock chip bond pads located along edge
116
of the memory chip, and power chip bond pads located along both edges
116
,
124
of the memory chip.
FIG. 2
, which is labeled “Prior Art” is a bond drawing for the known SDRAM device shown in
FIG. 1
mounted in a package
202
. By way of example, the package is a forty-four pin, thin small outline package (TSOP). As is shown in
FIG. 2
, the memory chip
102
is oriented lengthwise within the package in the conventional manner with the major axis of the memory chip extending along or parallel to the major axis of the package as is illustrated in FIG.
2
. The package includes address pins A
0
-A
3
, A
10
and BA, which extend along one side
204
of the package near one end
206
thereof and address input pins A
4
-A
9
which extend along the opposite side
208
of the package near end
206
. The package additionally includes data pins DQ
0
-DQ
3
which extend along side
204
of the package near the opposite end
210
of the package, and data pins DQ
4
-DQ
7
which extend along side
208
of the package near end
210
. Also shown in
FIG. 2
are the address chip bond pads
130
and the data chip bond pads
132
. The address chip bond pads
130
are connected to the address pins A
0
-A
10
and BA of the package in the conventional manner as represented by the dashed lines
212
and brackets. The data chip bond pads
132
are connected to the data pins DQ
0
-DQ
7
in the conventional manner as represented by the dashed lines
214
and brackets. The package includes further pins, such as clock and timing signal input pins CLK, CKE, DQM, RAS*, CAS*, WE* and CS*, that are connected to corresponding clock chip bond pads and power input pins, such as power input pins VCC, VSS, VSSQ and VCCQ, that are connected to corresponding power chip bond pads. To simplify the drawings, only the address chip bond pads
130
and the data chip bond pads
132
are shown connected to the address pins and the data pins, respectively, of the package.
In conventional memory packages, the memory chip is oriented lengthwise within the package, as is illustrated in
FIG. 2
, so that the address chip bond pads are located adjacent to the address pins A
0
-A
10
near one end
206
of the standard package, with some of the address pins located at one side of the package and the rest of the address pins located at the opposite side of the package. Also, the data chip bond pads are located adjacent to the data pins DQ
0
-DQ
7
near the opposite end
210
of the standard page, with some of the data pins located at one side of the package and the rest of the data pins located at the opposite side of the package.
However, the orientation of the memory chip within the package dictates the locations of the access circuits. In conventional circuits, this requires that different portions of the memory access circuits be located on opposite sides of the chip. Conventionally, for each memory array, the column address circuitry
112
(
FIG. 1
) is located at one end
114
of the memory array and the data output register
128
is located at the opposite end
116
of the memory array. This layout requires that the column select lines, such as column select lines
120
(FIG.
1
), run substantially the entire extent of the memory array from one end
114
to the opposite end
122
thereof, which introduces propagation delay into the data input/output path. Additional propagation delay is introduced by the data read/write lines
134
(
FIG. 1
) that connect the output of the sense amplifier circuits
118
to the data output register
128
because the data output register is located adjacent to the chip data bond pads
132
and is thus physically spaced apart from the data outputs of the memory arrays. The full length runs that are required for the column select lines and the data read/write lines dictate a high RC (resistor and capacitor) time constant for the column select lines and the data read/write lines which significantly impacts the operating time for the memory access circuits.
For the reasons stated above, and for other reasons which will become apparent to those skilled in the art upon reading and understanding the present specification, there is a need in the art for an improved architecture and package orientation for memory devices that speed up the operation of the memory device.
SUMMARY OF THE INVENTION
The present invention provides an architecture and package orientation for semiconductor memory devices, such as synchronous dynamic random access memory devices, which results in an increase in the operating speed of the memory devices.
In accordance with the invention, the memory chip is mounte

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