Optics: measuring and testing – With plural diverse test or art
Reexamination Certificate
2008-06-24
2008-06-24
Evans, F. L (Department: 2877)
Optics: measuring and testing
With plural diverse test or art
C356S313000, C356S318000
Reexamination Certificate
active
07391508
ABSTRACT:
Two or more high-frequency microphones are used to determine where an individual spark or other excitation beam strikes a sample in an optical emission spectroscopy (OES) instrument. The position of the spark can be correlated with the elemental composition of the material in the sample vaporized by the spark. The microphones are placed appropriately in air around a sparker of the instrument, or appropriately on the sample, or on both the sample and in the air. Arrival times of sound from the spark to the microphones, or a difference in the arrival times, yields information, from which the position of the spark relative to the microphones, and hence the absolute position of the spark, is deduced, such as by triangulation. Optionally or in addition, a signal that indicates a time when the spark is produced is correlated with one or more spectra detected by a spectrometer, so a spectrum that results from the vaporized sample can be distinguished from a spectrum that results from heated gas above the sample.
REFERENCES:
patent: 4641250 (1987-02-01), Strong
patent: 4804603 (1989-02-01), Liston
patent: 4956824 (1990-09-01), Sindeband et al.
patent: 4973800 (1990-11-01), Sindeband et al.
patent: 5009277 (1991-04-01), Sindeband et al.
patent: 5050134 (1991-09-01), Butler
patent: 5216482 (1993-06-01), Fukui et al.
patent: 5216817 (1993-06-01), Misevich et al.
patent: 5252834 (1993-10-01), Lin
patent: 5308936 (1994-05-01), Biggs et al.
patent: 5379269 (1995-01-01), Sindeband et al.
patent: 6008896 (1999-12-01), Sabsabi et al.
patent: 6359687 (2002-03-01), Cheng
patent: 6466309 (2002-10-01), Kossakovski et al.
patent: 2002/0130668 (2002-09-01), Blades
patent: 2003/0197125 (2003-10-01), De Saro et al.
patent: 2004/0199079 (2004-10-01), Chuck et al.
patent: 0 396 291 (1990-11-01), None
International Search Report; dated Feb. 5, 2007; received Feb. 9, 2007; PCT/US2006/027374.
Chaleaard, C., et al., “Correction of Matrix Effects in Quantitative Elemental Analysis with Laser Ablation Optical Emission Spectrometry,”Journal of Analytical Atomic Spectrometry, vol. 12, No. 2, Feb. 1997, pp. 183-185.
International Search Report, dated Nov. 17, 2006, Received Nov. 27, 2006, PCT/US2006/027374.
GTCO GP9 Sonic Digitizer product description—PBSolutions; http://www.pbsolutions.com/gtco—gp9.html pp. 1-3, undated.
Transducer Types http://www.ndt-ed.org/EducationResources/CommunityCollege/Ultrasonics/EquipmentTra...html pp. 2-3, undated.
Bromberg & Sunstein LLP
Evans F. L
Thermo Niton Analyzers LLC
LandOfFree
Arc/spark optical emission spectroscopy correlated with... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Arc/spark optical emission spectroscopy correlated with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arc/spark optical emission spectroscopy correlated with... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2808395