ARC range test facility

Details ARC range test facility ARC range test facility

1992-07-01

1993-04-20

Blum, Theodore M.

Communications: directive radio wave systems and devices (e.g.,

Directive

Including antenna pattern plotting

H01Q 300

Patent

active

052046850

ABSTRACT:
In order to measure the far field antenna pattern of a phased array antenna, the phased array is focused at a probe antenna which is a specific distance away from the aperture. The antenna pattern is then measured by moving the probe antenna on a constant focal arc. This arc minimizes phase aberrations due to defocusing error. To minimize amplitude errors, the pattern of the probe antenna is carefully matched to compensate for the variation induced amplitude error.

REFERENCES:
patent: 3879733 (1973-04-01), Hansen et al.
patent: 4218683 (1980-08-01), Hemming
patent: 4553145 (1985-11-01), Evans
patent: 4661820 (1987-04-01), Pouit et al.
patent: 4998112 (1991-05-01), Franchi et al.

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