Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2007-08-07
2007-08-07
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S536000, C361S042000
Reexamination Certificate
active
10341483
ABSTRACT:
A circuit breaker for locating an arc fault for a protected circuit includes separable contacts interrupting the protected circuit and an arc fault detector determining an arc fault in the protected circuit. An analog to digital converter circuit measures a value of peak arc current at the arc fault detector. Another analog to digital converter circuit provides a peak line-to-neutral voltage. A memory provides an arc voltage operatively associated with the value of peak current. A microprocessor determines a distance from the arc fault detector to the arc fault from the value of peak arc current, a wire resistance per unit length or a wire conductance per unit length, the peak line-to-neutral voltage and the arc voltage.
REFERENCES:
patent: 4144487 (1979-03-01), Pharney
patent: 4441073 (1984-04-01), Davis
patent: 4803635 (1989-02-01), Andow
patent: 4841405 (1989-06-01), Udren
patent: 5543995 (1996-08-01), Kumagai et al.
patent: 5659453 (1997-08-01), Russell et al.
patent: 5682101 (1997-10-01), Brooks et al.
patent: 5706159 (1998-01-01), Dollar et al.
patent: 5963406 (1999-10-01), Neiger et al.
patent: 5995588 (1999-11-01), Crick
patent: 6088205 (2000-07-01), Neiger et al.
patent: 6128169 (2000-10-01), Neiger et al.
patent: 6137418 (2000-10-01), Zuercher et al.
patent: 6259996 (2001-07-01), Haun et al.
patent: 6426632 (2002-07-01), Clunn
patent: 6477021 (2002-11-01), Haun et al.
patent: 6522509 (2003-02-01), Engel et al.
patent: 6552884 (2003-04-01), Kim et al.
patent: 6744260 (2004-06-01), Schmalz et al.
patent: 2002/0024782 (2002-02-01), Kim et al.
patent: 2003/0023884 (2003-01-01), See et al.
Funabashi et al., “Influence of Fault Arc Characteristics on the Accuracy of Digital Fault Locators”, Apr. 2001, IEEE Transactions on Power Delivery vol. 16, No. 2; pp. 195-199.
Engel Joseph C.
Hetzmannseder Engelbert
Parker Kevin L.
Theisen Peter J.
Zuercher Joseph C.
Deb Anjan
Eaton Corporation
Lithoff, Jr. Loren H.
Natalini Jeff
Ūnion Marvin L.
LandOfFree
Arc fault detector and method for locating an arc fault does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Arc fault detector and method for locating an arc fault, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arc fault detector and method for locating an arc fault will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3878549