Arc detection using discrete wavelet transforms

Electricity: electrical systems and devices – Safety and protection of systems and devices – Ground fault protection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S115000

Reexamination Certificate

active

08054591

ABSTRACT:
An apparatus to perform series and parallel arc fault current interruption (AFCI). The apparatus includes a resistive element configured to sense a load from which a current signal is generated, a first detection unit configured to output a first signal based on the current signal, and a microcontroller configured to decompose at least the first signal via discrete wavelet transforms to thereby obtain discrete wavelet coefficients, and to generate a trip signal when the discrete wavelet coefficients indicate that a threshold condition for trip signal generation are satisfied.

REFERENCES:
patent: 4514709 (1985-04-01), Nakano et al.
patent: 5185684 (1993-02-01), Beihoff et al.
patent: 5185685 (1993-02-01), Tennies et al.
patent: 5185686 (1993-02-01), Hansen et al.
patent: 5185687 (1993-02-01), Beihoff et al.
patent: 5208542 (1993-05-01), Tennies et al.
patent: 5223795 (1993-06-01), Blades
patent: 5434509 (1995-07-01), Blades
patent: 5452223 (1995-09-01), Zuercher et al.
patent: 5485093 (1996-01-01), Russell et al.
patent: 5506789 (1996-04-01), Russell et al.
patent: 5512832 (1996-04-01), Russell et al.
patent: 5550751 (1996-08-01), Russell
patent: 5561605 (1996-10-01), Zuercher et al.
patent: 5578931 (1996-11-01), Russell et al.
patent: 5600526 (1997-02-01), Russell et al.
patent: 5659453 (1997-08-01), Russell et al.
patent: 5682101 (1997-10-01), Brooks et al.
patent: 5691869 (1997-11-01), Engel et al.
patent: 5726577 (1998-03-01), Engel et al.
patent: 5729145 (1998-03-01), Blades
patent: 5805397 (1998-09-01), MacKenzie
patent: 5815352 (1998-09-01), MacKenzie
patent: 5835321 (1998-11-01), Elms et al.
patent: 5839092 (1998-11-01), Erger et al.
patent: 5933305 (1999-08-01), Schmalz et al.
patent: 5969920 (1999-10-01), MacKenzie
patent: 5982593 (1999-11-01), Kimblin et al.
patent: 5986860 (1999-11-01), Scott
patent: 6031699 (2000-02-01), Dollar, II et al.
patent: 6052046 (2000-04-01), Ennis et al.
patent: 6128170 (2000-10-01), Daum
patent: 6137418 (2000-10-01), Zuercher et al.
patent: 6191589 (2001-02-01), Clunn
patent: 6195241 (2001-02-01), Brooks et al.
patent: 6198611 (2001-03-01), MacBeth
patent: 6232857 (2001-05-01), Mason, Jr. et al.
patent: 6239962 (2001-05-01), Seymour et al.
patent: 6255923 (2001-07-01), Mason, Jr. et al.
patent: 6259996 (2001-07-01), Haun et al.
patent: D450660 (2001-11-01), Seymour et al.
patent: 6313642 (2001-11-01), Brooks
patent: 6362628 (2002-03-01), MacBeth et al.
patent: 6373257 (2002-04-01), MacBeth et al.
patent: 6377055 (2002-04-01), MacBeth
patent: 6388849 (2002-05-01), Rae
patent: 6414829 (2002-07-01), Haun
patent: 6417671 (2002-07-01), Tiemann
patent: 6426632 (2002-07-01), Clunn
patent: 6459273 (2002-10-01), Dollar, II et al.
patent: 6504692 (2003-01-01), MacBeth et al.
patent: 6522228 (2003-02-01), Wellner et al.
patent: 6522509 (2003-02-01), Engel et al.
patent: 6532139 (2003-03-01), Kim et al.
patent: 6538863 (2003-03-01), MacBeth
patent: 6542056 (2003-04-01), Nerstrom et al.
patent: 6545574 (2003-04-01), Seymour et al.
patent: 6556397 (2003-04-01), Kim et al.
patent: 6570392 (2003-05-01), MacBeth et al.
patent: 6590754 (2003-07-01), MacBeth
patent: 6608741 (2003-08-01), MacBeth
patent: 6621669 (2003-09-01), Haun et al.
patent: 6625550 (2003-09-01), Scott et al.
patent: 6628487 (2003-09-01), MacBeth
patent: 6633467 (2003-10-01), MacBeth et al.
patent: 6642832 (2003-11-01), Pellon et al.
patent: 6654219 (2003-11-01), Romano et al.
patent: 6678137 (2004-01-01), Mason, Jr. et al.
patent: 6703842 (2004-03-01), Itimura et al.
patent: 6707651 (2004-03-01), Elms et al.
patent: 6720872 (2004-04-01), Engel et al.
patent: 6777953 (2004-08-01), Blades
patent: 6791315 (2004-09-01), Skerritt et al.
patent: 6798628 (2004-09-01), MacBeth
patent: 6833713 (2004-12-01), Schoepf et al.
patent: 6839208 (2005-01-01), MacBeth et al.
patent: 6876203 (2005-04-01), Blades
patent: 6882158 (2005-04-01), Blades
patent: 6927579 (2005-08-01), Blades
patent: 6927597 (2005-08-01), Kliman et al.
patent: 6972937 (2005-12-01), MacBeth et al.
patent: 6980407 (2005-12-01), Kawate et al.
patent: 6999289 (2006-02-01), MacBeth et al.
patent: 7009406 (2006-03-01), Naidu et al.
patent: 7062388 (2006-06-01), Rivers et al.
patent: 7069116 (2006-06-01), Kunsman et al.
patent: 7106069 (2006-09-01), Kim et al.
patent: 7136265 (2006-11-01), Wong et al.
patent: 7148696 (2006-12-01), Zhou et al.
patent: 7151656 (2006-12-01), Dvorak et al.
patent: 7205772 (2007-04-01), Naidu et al.
patent: 7253637 (2007-08-01), Dvorak et al.
patent: 7359168 (2008-04-01), Elms et al.
patent: 7362553 (2008-04-01), Elms et al.
patent: 7391218 (2008-06-01), Kojori et al.
patent: 7403129 (2008-07-01), Zhou et al.
patent: 7409303 (2008-08-01), Yeo et al.
patent: 7463465 (2008-12-01), Rivers, Jr. et al.
patent: 2001/0033469 (2001-10-01), MacBeth et al.
patent: 2001/0036047 (2001-11-01), MacBath et al.
patent: 2002/0033701 (2002-03-01), MacBath et al.
patent: 2002/0038199 (2002-03-01), Blemel
patent: 2002/0051546 (2002-05-01), Bizjak
patent: 2002/0080003 (2002-06-01), Pellon et al.
patent: 2002/0085327 (2002-07-01), Kim et al.
patent: 2002/0097056 (2002-07-01), Blades
patent: 2002/0130668 (2002-09-01), Blades
patent: 2002/0196031 (2002-12-01), Blades
patent: 2003/0072113 (2003-04-01), Wong et al.
patent: 2003/0074148 (2003-04-01), Dvorak et al.
patent: 2003/0098982 (2003-05-01), McLeod et al.
patent: 2003/0201780 (2003-10-01), Blades
patent: 2003/0205460 (2003-11-01), Buda
patent: 2004/0043255 (2004-03-01), Horai et al.
patent: 2004/0095695 (2004-05-01), Kim et al.
patent: 2004/0100274 (2004-05-01), Gloster et al.
patent: 2004/0150410 (2004-08-01), Schoeqf et al.
patent: 2004/0172207 (2004-09-01), Hancock et al.
patent: 2004/0182697 (2004-09-01), Buda
patent: 2005/0207083 (2005-09-01), Rivers et al.
patent: 2005/0264962 (2005-12-01), Kim et al.
patent: 2006/0015703 (2006-01-01), Ramchandran et al.
patent: 2006/0164097 (2006-07-01), Zhou et al.
patent: 2006/0203401 (2006-09-01), Kojori et al.
patent: 2006/0214670 (2006-09-01), Naidu et al.
patent: 2006/0279883 (2006-12-01), Elms et al.
patent: 2007/0057678 (2007-03-01), Dvorak et al.
patent: 2007/0086124 (2007-04-01), Elms et al.
patent: 2007/0260346 (2007-11-01), Ganesan et al.
patent: 2007/0263329 (2007-11-01), Zhou et al.
patent: 2008/0204949 (2008-08-01), Zhou et al.
patent: 2008/0238404 (2008-10-01), Ferguson
patent: 2009/0040666 (2009-02-01), Elms et al.
patent: 2009/0088988 (2009-04-01), Muthu-Mannivannan et al.
patent: 1329733 (2006-05-01), None
patent: 1657559 (2006-05-01), None
patent: 2381607 (2003-05-01), None
patent: 9422031 (1994-09-01), None
patent: 9635250 (1996-11-01), None
patent: 2007035488 (2007-03-01), None
patent: 2007035488 (2007-03-01), None
Leung; “Predictive Maintenance of Circuit Breakers”; University of Waterloo, Waterloo, Ontario, Canada, 2007.
Sedighi et al.; “High impedance fault detection based on wavelet transform and statistical pattern recognition”; IEEE Transactions on Power Delivery, vol. 20, Issue 4, Oct. 2005; pp. 2414-2421.
Sultan et al.; “Detection of high impedance arcing faults using a multi-layer perceptron”; IEEE Transaction on Power Delivery, vol. 7, Issue 4, 1992; pp. 1871-1877.
Al-Dabbagh et al.; “Improved microprocessor based distribution feeder earth fault protection using pattern recognition”; Proceedings of the Fourth International Conference on Development in Power Protection 1989; pp. 172-176.
Elkalashy; “Modeling and Detection of High Impedance Arcing Fault in Medium Voltage Networks”; TKK Dissertations 95, Espoo 2007.
Kadiver et al.; “An Adaptive Auto Reclosure Scheme using Wavelet Transform”; University of Tehran, Tehran, Iran.
Lai et al.; “Wavelet Transform Based Relay Algorithm for the Detection of Stochastic High Impedance Faults”; International Conference on Power Systems Transients—IPST 2003 in New Orleans, USA.
Leung; “Predictive Maintenance of Circuit Breakers”; University of Waterloo, Waterloo, Ontario, Canada.
Sedighi et al.; “High impedance fault detection based on wavelet t

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Arc detection using discrete wavelet transforms does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Arc detection using discrete wavelet transforms, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arc detection using discrete wavelet transforms will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4281827

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.