Aqueous cleaning composition containing copper-specific...

Compositions – Etching or brightening compositions

Reexamination Certificate

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C252S079200, C252S079300, C252S079400, C438S706000, C438S745000, C134S001200, C134S001300

Reexamination Certificate

active

06896826

ABSTRACT:
A semiconductor wafer cleaning formulation, including 1-35% wt. fluoride source, 20-60% wt. organic amine(s), 0.1-40% wt. nitrogenous component, e.g., a nitrogen-containing carboxylic acid or an imine, 20-50% wt. water, and 0-21% wt. metal chelating agent(s). The formulations are useful to remove residue from wafers following a resist plasma ashing step, such as inorganic residue from semiconductor wafers containing delicate copper interconnecting structures.

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