Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate
2005-04-12
2005-04-12
Allen, Stephone B. (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Photocell controlled circuit
C250S214100, C348S308000, C257S222000
Reexamination Certificate
active
06878918
ABSTRACT:
A circuit and method are described which suppresses reset noise in active pixel sensor arrays. A circuit having a number of N−wells formed in a P−silicon epitaxial layer or a number of P−wells formed in an N−silicon epitaxial layer is provided. A pixel is formed in each of the wells so that each of the wells is surrounded by silicon of the opposite polarity and an array of pixels is formed. Means are provided for selectively combining or binning adjacent N−or P−wells. During the reset period of the imaging cycle selected groups of adjacent pixels are binned and the charge injected by the resetting of a pixel is averaged among the neighboring pixels, thereby reducing the effect of this charge injection on any one of the pixels and thus reducing the noise generated. The reset is accomplished using a PMOS transistor formed in each N−well or an NMOS transistor formed in each P−well. The selective binning is accomplished using NMOS or PMOS transistors formed in the region between adjacent wells. Conductive traces between adjacent wells can also be used to accomplish the selective binning.
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Ackerman Stephen B.
Allen Stephone B.
Dialdg Semiconductor GmbH
Lee Patrick J.
Prescott Larry J.
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