Application specific integrated circuit chip and method of testi

Details Application specific integrated circuit chip and method of testi Application specific integrated circuit chip and method of testi

1996-12-18

1999-10-05

Beausoliel, Jr., Robert W.

Excavating

39518306, G01R 3128

Patent

active

059635665

ABSTRACT:
An application specific integrated circuit having an embedded microprocessor and core including a memory array, self tests at full operational speed utilizing the computational power of the embedded microprocessor for deterministic testing performed by core specific test algorithms implemented in the assembly code of the embedded microprocessor.

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