Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2006-01-24
2006-01-24
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
06989893
ABSTRACT:
The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.
REFERENCES:
patent: 6519026 (2003-02-01), Holland
patent: 6611322 (2003-08-01), Nakayama et al.
patent: 2005/0002017 (2005-01-01), Haran
Audet, Francis et al.: “Testing Procedure for Network Deployment” EXFO Application Note 086, Electro-Optical Engineering Inc. (2003); currently available at http://documents.exfo.com/appnotes/anote086-ang.pdf.
Asher Michael
Eslambolchi Hossein
Giddens Chuck
Huffman John Sinclair
Stewart Harold
AT&T Corp.
Nguyen Tu T.
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