Application of statistical inference to optical time domain...

Details Application of statistical inference to optical time domain... Application of statistical inference to optical time domain...

2008-07-08

2008-07-08

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

07397545

ABSTRACT:
The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.

REFERENCES:
patent: 7016024 (2006-03-01), Bridge et al.
patent: 7173690 (2007-02-01), Haran

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