Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Patent
1980-03-03
1982-09-07
Lee, John D.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
324 77K, 350 9612, G02B 5174
Patent
active
043480748
ABSTRACT:
A method of improving the signal-to-noise ratio (dynamic range) in integrated optical spectrum analyzers. An integrated optical spectrum analyzer is formed with a lithium niobate (LiNbO.sub.3) substrate in its usual manner. Ions such as argon or hydrogen are implanted in the bottom and sides of the LiNbO.sub.3 which causes the substrate to absorb light at the wavelength of interest. The ion-implanted bottom and sides provide absorption with very little reflectivity and the amount of absorption is proportional to the effect of the ion and the time period of implantation. The bottom and sides behave as optical sinks, rather than as reflection or scattering centers.
REFERENCES:
patent: 3873828 (1975-03-01), Hunsperger et al.
patent: 4253060 (1981-02-01), Chen
patent: 4274049 (1981-06-01), Stoll
Wei et al., "Large Refractive Index Change Induced by Ion Implantation In . . ", Appl. Phys. Lett., vol. 25, No. 6, Sep. 1974, pp. 329-331.
Anderson, "Integrated Optical Spectrum Analyzer: . . . ", IEEE Spectrum, Dec. 1978, pp. 22-29.
Burns et al., "Applications of Ion Implantation to Integrated Optical Spectrum Analyzers", Optics Letters, vol. 5, No. 2, Feb. 1980, pp. 45-47.
Burns William K.
Giallorenzi Thomas G.
Beers Robert F.
Crane Melvin L.
Ellis William T.
Lee John D.
The United States of America as represented by the Secretary of
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