Application of comprehensive calibration to mass spectral...

Details Application of comprehensive calibration to mass spectral... Application of comprehensive calibration to mass spectral...

2006-05-30

2008-11-11

Nguyen, Kiet T (Department: 2881)

Data processing: measuring, calibrating, or testing

Calibration or correction system

C702S076000

Reexamination Certificate

active

07451052

ABSTRACT:
A method of performing mass spectral analysis involving at least one of the isotope satellites of at least one ion, comprising acquiring a measured mass spectral response including at least one of the isotope satellites; constructing a peak component matrix with mass spectral response functions; performing a regression analysis between the acquired mass spectral response and the peak component matrix; and reporting one of statistical measure and regression coefficients from the regression analysis for at least one of mass spectral peak purity assessment, ion charge determination, mass spectral deconvolution, and mass shift compensation. A method for the identification of an ion in a sample through acquired MS scans, comprising obtaining an isotope pattern of an ion; constructing a projection matrix based on the isotope pattern or MS scan; projecting the isotope pattern or MS scan onto the projection matrix to calculate at least one of projection residual and projected data; and performing a statistical test on at least one of the projection residual and projected data to determine if the ion exists in the sample or if there is interference. A method which takes advantage of mass defect or isotope pattern analysis, and software and hardware for implementing all aspects of the invention.

REFERENCES:
patent: 6983213 (2006-01-01), Wang
patent: 2006/0217911 (2006-09-01), Wang
patent: 2006/0255258 (2006-11-01), Wang et al.
patent: 2007/0136017 (2007-06-01), Wang et al.

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