Application of abnormal event detection technology to...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S183000

Reexamination Certificate

active

07424395

ABSTRACT:
The present invention is a method for detecting an abnormal event for process units of an ethylene processing system. The method compares the operation of the process units to a model developed by principal components analysis of normal operation for these units. If the difference between the operation of a process unit and the normal operation indicates an abnormal condition, then the cause of the abnormal condition is determined and corrected.

REFERENCES:
patent: 3175968 (1965-03-01), Berger
patent: 5023045 (1991-06-01), Watanabe et al.
patent: 5333240 (1994-07-01), Matsumoto et al.
patent: 5351247 (1994-09-01), Dow et al.
patent: 5457625 (1995-10-01), Lim et al.
patent: 5465321 (1995-11-01), Smyth
patent: 5539877 (1996-07-01), Winokur et al.
patent: 5817958 (1998-10-01), Uchida et al.
patent: 5859964 (1999-01-01), Wang et al.
patent: 5949677 (1999-09-01), Ho
patent: 5949678 (1999-09-01), Wold et al.
patent: 5950147 (1999-09-01), Sarangapani et al.
patent: 6115656 (2000-09-01), Sudolsky
patent: 6368975 (2002-04-01), Balasubramhanya et al.
patent: 6466877 (2002-10-01), Chen et al.
patent: 6505145 (2003-01-01), Bjornson
patent: 6521080 (2003-02-01), Balasubramhanya et al.
patent: 6522978 (2003-02-01), Chen et al.
patent: 6564119 (2003-05-01), Vaculik et al.
patent: 6606580 (2003-08-01), Zedda et al.
patent: 6625569 (2003-09-01), James et al.
patent: 6636842 (2003-10-01), Zambrano et al.
patent: 6681344 (2004-01-01), Andrew
patent: 6735541 (2004-05-01), Kern et al.
patent: 6760639 (2004-07-01), Kallela et al.
patent: 6809837 (2004-10-01), Mestha et al.
patent: 6813532 (2004-11-01), Eryurck et al.
patent: 6904386 (2005-06-01), Mylaraswamy
patent: 6907383 (2005-06-01), Eryurek et al.
patent: 6917839 (2005-07-01), Bickford
patent: 6925338 (2005-08-01), Eryurek et al.
patent: 6954713 (2005-10-01), Eryurek
patent: 6973396 (2005-12-01), Shah et al.
patent: 6978210 (2005-12-01), Suter et al.
patent: 6980938 (2005-12-01), Cutler
patent: 7079984 (2006-07-01), Eryurek
patent: 7085610 (2006-08-01), Eryurek et al.
patent: 7096074 (2006-08-01), Yulevitch et al.
patent: 7181654 (2007-02-01), Ford, Jr. et al.
patent: 7243048 (2007-07-01), Foslien et al.
patent: 2002/0077792 (2002-06-01), Qiu
patent: 2004/0078171 (2004-04-01), Wegerich et al.
patent: 2004/0078683 (2004-04-01), Buia et al.
patent: 2004/0172229 (2004-09-01), Aragones et al.
patent: 2005/0141782 (2005-06-01), Guralnik et al.
patent: 2005/0149297 (2005-07-01), Guralnik et al.
patent: 2005/0197805 (2005-09-01), Eryurek et al.
patent: 2005/0267702 (2005-12-01), Shah et al.
patent: 2005/0267710 (2005-12-01), Heavner, III et al.
patent: 2006/0020423 (2006-01-01), Sharpe, Jr.
patent: 2006/0036403 (2006-02-01), Wegerich et al.
patent: 2006/0073013 (2006-04-01), Emigholz et al.
patent: 2007/0005266 (2007-01-01), Blevins et al.
patent: 2007/0088448 (2007-04-01), Mylaraswamy et al.
patent: 2007/0088528 (2007-04-01), Miller
patent: 2007/0088534 (2007-04-01), MacArthur et al.
patent: 2007/0124113 (2007-05-01), Foslien et al.
patent: 0 428 135 (1991-05-01), None
patent: 02-2408 (1990-01-01), None
patent: 10-143343 (1998-05-01), None
Bell, Michael B., NOVA Chemicals; Foslien, Wendy K., Honeywell; “Early Event Detection—Results From A Prototype Implementation”, 2005 Spring National Meeting Atlanta GA, Apr. 10-14, 17thAnnual Ethylene Producers' Conference Session TA006—Ethylene Plant Process Control.
Mylaraswamy, Dinkar, Bullemer, Peter, Honeywell Laboratories; Emigholz, Ken, Emre, ExxonMobil, “Fielding a Multiple State Estimator Platform”, NPRA Computer Conference, Chicago, IL, Nov. 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Application of abnormal event detection technology to... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Application of abnormal event detection technology to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Application of abnormal event detection technology to... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3982494

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.