Application of 2-dimensional photonic crystals in alignment...

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks

Reexamination Certificate

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C257SE23179, C438S401000, C430S005000, C977S773000

Reexamination Certificate

active

07944063

ABSTRACT:
Alignment marks for use on substrates. In one example, the alignment marks consist of periodic 2-dimensional arrays of structures, the spacing of the structures being smaller than an alignment beam but larger than an exposure beam.

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G. Subramania et al., “Fabrication of three-dimensional photonic cyrstal with alignment based on electron beam lithography”, Applied Physics Letters, vol. 85, No. 21, Nov. 22, 2004, pp. 5037-5039.
Philippe Lalanne, et al., “Antireflection Behavior of Silicon Subwavelength Periodic Structures for Visible Light,” Nanotechnology 8 (1997), pp. 53-56.
English translation of Japanese Official Action issued on Jun. 16, 2009 in Japanese Application No. 2006-150762.

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