Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate
2011-05-17
2011-05-17
Coleman, W. David (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Alignment marks
C257SE23179, C438S401000, C430S005000, C977S773000
Reexamination Certificate
active
07944063
ABSTRACT:
Alignment marks for use on substrates. In one example, the alignment marks consist of periodic 2-dimensional arrays of structures, the spacing of the structures being smaller than an alignment beam but larger than an exposure beam.
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English translation of Japanese Official Action issued on Jun. 16, 2009 in Japanese Application No. 2006-150762.
Musa Sami
Van Haren Richard Johannes Franciscus
ASML Netherlands B.V.
Coleman W. David
Pillsbury Winthrop Shaw & Pittman LLP
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