Apparatuses and methods for repairing defects in a circuit

Details Apparatuses and methods for repairing defects in a circuit Apparatuses and methods for repairing defects in a circuit

2007-09-25

2007-09-25

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S523000, C324S718000, C324S765010

Reexamination Certificate

active

11378217

ABSTRACT:
Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an acquired image of the circuit or by measuring the strength of a signal emitted across a pair of conductor plates. If defects are detected, conductive particles may be applied to the circuit to correct the detected defects.

REFERENCES:
patent: 5764793 (1998-06-01), Omae et al.
patent: 5883437 (1999-03-01), Maruyama et al.
patent: 6144210 (2000-11-01), Brooks
patent: 6253621 (2001-07-01), Jarvis
patent: 2005/0046435 (2005-03-01), Ishikawa et al.
patent: 2006/0043153 (2006-03-01), Yamaoka et al.

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