Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-22
2008-07-22
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
07403027
ABSTRACT:
An apparatus and method for selecting and outputting test patterns and internal signals during various SHBI modes of operation. The apparatus may include multiple input/output (I/O) pins, one or more functional blocks, a Self-Heat Burn-In (SHBI) state machine that is coupled to the I/O pins and the one or more functional blocks, and a logic selector circuitry that is coupled to the SHBI state machine and the one or more functional blocks. The SHBI state machine may provide to the I/O pins with first one or more test patterns during a first SHBI mode of operation, and to provide the one or more functional blocks with second one or more test patterns during a second SHBI mode of operation. The logic selector circuitry is configured to select and output the first one or more test patterns to stress the I/O pins during the first SHBI mode of operation, and to select and output internal signals of the one more functional blocks during the second SHBI mode of operation.
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Balasingam Naveendran
Lee Yuen Tat
Low Soon Eng
Intel Corporation
Kusumakar Karen M
Nguyen Ha
Schwabe Williamson & Wyatt P.C.
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