Apparatus within an integrated circuit for automatically detecti

Details Apparatus within an integrated circuit for automatically detecti Apparatus within an integrated circuit for automatically detecti

1995-01-26

1996-05-14

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 61, 327292, 327298, G04F 900

Patent

active

055171095

ABSTRACT:
An integrated circuit (IC) includes circuitry for generating a clock signal during both a normal mode of operation and a test mode of operation. During the normal mode, an input clock signal is delayed via a skew corrector. In test mode, an input test clock signal bypasses the skew corrector via a clock signal source selector. The clock signal source selector is controlled automatically by a mode detector that responds to the input clock signals to determine the mode of operation of the IC.

REFERENCES:
patent: 3675127 (1972-07-01), Mekiernan
patent: 4272777 (1981-06-01), Fitzgerald
patent: 4293870 (1981-10-01), Steckler et al.
patent: 4365203 (1982-12-01), DiMassimo et al.
patent: 4724380 (1988-02-01), Burrows et al.
patent: 4800564 (1989-01-01), DeFazio et al.
patent: 5065042 (1991-11-01), Thomsen et al.
patent: 5066868 (1991-11-01), Doty et al.
patent: 5079623 (1992-01-01), Sendelweck et al.

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