Apparatus to oscillograph single sub-nanosecond events

Details Apparatus to oscillograph single sub-nanosecond events Apparatus to oscillograph single sub-nanosecond events

1998-11-23

2000-08-08

Wachsman, Hal

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

702 67, 324 7654, G01R 2902

Patent

active

061014540

ABSTRACT:
This invention transforms a single sub-nanosecond event into a repetitive event, which then can be used as input to a conventional high bandwidth digital sampling oscilloscope by utilizing a delay line switched to form a closed loop provided with a gain. The single event, as a single pulse of a series of repetitive pulses, is allowed to enter and circulate around the loop where it is amplified and periodically read out to a readout device.

REFERENCES:
patent: 4641246 (1987-02-01), Halbert et al.
patent: 5148373 (1992-09-01), Dent
patent: 5555119 (1996-09-01), Lewis

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