Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-05-02
2006-05-02
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S121000, C702S122000, C702S123000
Reexamination Certificate
active
07039545
ABSTRACT:
Test development tools, systems and/or methods which include providing access to a pre-established serial test program having a series of test code portions; providing for evaluating the series of test code portions and determining whether any respective test code portions of the series of test code portions are independently operable thereby allowing for combination in a new test program, the evaluating and determining steps providing at least one output result thereof; and providing for defining a new test program including a new test code portion for at least partially concurrently testing first and second sub-parts of a device under test using the at least one output result of the evaluating and determining steps.
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Agilent Technologies, www.agilent.com/see/concurrentest, “Agilent Concurrent Test” Nov. 1, 2001, 2 pages.
Agilent Technologies, www.agilent.com/cgi-bin/bvpub/agilent/editorial, “Concurrest Test Backgrounder”, Aug. 13, 2003, 3 pages.
go/semiconductor, “Concurrent Test allows parrallel testing of IPblocks within each device”, Autumn 2001, pp. 16, 1 page.
Mark LaPedus, Silicon Strategies, www.siliconstrategies.com, “Agilent claims breakthrough in test reuse' for SoCs”, May 30, 2003, 2 pages.
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Bundy Laura Marie
Keahey Julia Ann
Agilent Technologie,s Inc.
Bui Bryan
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