Apparatus, system, and method for testing an analog to...

Details Apparatus, system, and method for testing an analog to... Apparatus, system, and method for testing an analog to...

2006-05-02

2006-05-02

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

C702S118000, C702S126000, C341S120000

Reexamination Certificate

active

07039540

ABSTRACT:
An apparatus, system, and method are disclosed for testing an analog to digital converter with a known analog signal applied. A first register module stores a first digitized instance of an analog signal. A second register module stores a second digitized instance of the analog signal. A difference module calculates the absolute difference between the first and second digitized instances. A bad code module identifies an erroneous digitized instance wherein the absolute difference is greater than a limit value. In one embodiment, a counter module counts the erroneous digitized instance. A test system may identify a failed analog to digital converter if the erroneous digitized instance count is greater than a specified target value.

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