Apparatus, system, and method for managing aging of an...

Details Apparatus, system, and method for managing aging of an... Apparatus, system, and method for managing aging of an...

2006-02-28

2006-02-28

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C345S519000

Reexamination Certificate

active

07005871

ABSTRACT:
An integrated circuit includes an accelerated aging circuit block that has at least one circuit that ages at a faster rate than a functional circuit block. The accelerated aging circuit block is monitored during normal operation of the integrated circuit. Changes in the accelerated aging circuit block are used to generate data indicative of an aging trend for the functional circuit block.

REFERENCES:
patent: 5719800 (1998-02-01), Mittal et al.
patent: 6282625 (2001-08-01), Porterfield
patent: 6359624 (2002-03-01), Kunimatsu

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