Thermal measuring and testing – Temperature measurement – Combined with diverse art device
Reexamination Certificate
2007-02-21
2011-10-04
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
Combined with diverse art device
C374S152000, C374S001000, C374S004000, C374S057000, C374S170000, C702S130000, C702S099000, C324S760020, C320S150000
Reexamination Certificate
active
08029187
ABSTRACT:
A temperature measuring and identification (TMID) device obtains identification information and temperature information of a connected device having a temperature sensing circuit (TSC). The TSC includes a temperature sensing element (TSE) connected in parallel with a voltage clamping network (VCN) that limits the voltage across the TSE to an identification voltage within an identification voltage range when the voltage is greater than or equal to a lower voltage of the identification voltage range. When a voltage below the lower range is applied to the TSC, the VCN appears as an open circuit and the resistance of the TSC corresponds to temperature. A translation circuit within the TMID shifts TSC voltages within the identification voltage range to a normalization voltage range. Accordingly, voltages corresponding to temperature as well as voltages corresponding to identification are within the normalization voltage range. As a result, the resolution of a voltage sensing device used for measuring the temperature and identification voltages is maximized. In addition, the translation circuit maintains a minimal current during a rest state. For cost or other concerns, a first TSC may omit the VCN to provide a maximum identification voltage and other TSCs may include VCNs with lower identification voltage ranges.
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Taylor John P.
Thoma Jeffrey M.
Kyocera Corporation
Verbitsky Gail
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