Apparatus, system, and method for determining a...

Details Apparatus, system, and method for determining a... Apparatus, system, and method for determining a...

2007-07-19

2009-08-11

Allen, Andre J (Department: 2855)

Thermal measuring and testing

Temperature measurement

Composite temperature-related paramenter

C060S277000

Reexamination Certificate

active

07572054

ABSTRACT:
An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.

REFERENCES:
patent: 4007435 (1977-02-01), Tien
patent: 6597276 (2003-07-01), Chiang et al.
patent: 2004/0056753 (2004-03-01), Chiang et al.
patent: 2008/0163610 (2008-07-01), Baird et al.

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