Thermal measuring and testing – Leak or flaw detection
Reexamination Certificate
2011-03-08
2011-03-08
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Leak or flaw detection
C374S178000, C324S500000, C324S760020, C702S130000
Reexamination Certificate
active
07901131
ABSTRACT:
In a method for determining a state of an apparatus, detected temperatures are received from a plurality of sensors and are compared to at least one preset condition. The state of the apparatus is determined based upon the comparison.
REFERENCES:
patent: 4257552 (1981-03-01), Farkas et al.
patent: 4306293 (1981-12-01), Marathe
patent: 4315243 (1982-02-01), Calvert, Sr.
patent: 4504156 (1985-03-01), Currie et al.
patent: 5623594 (1997-04-01), Swamy
patent: 5956663 (1999-09-01), Eryurek
patent: 6257319 (2001-07-01), Kainuma et al.
patent: 6262584 (2001-07-01), Kurosu et al.
patent: 7111211 (2006-09-01), Co et al.
patent: 7249718 (2007-07-01), Beitelmal et al.
patent: 7347621 (2008-03-01), Sri-Jayantha et al.
patent: 2002/0039280 (2002-04-01), O'Connor et al.
patent: 2004/0129067 (2004-07-01), Mauro et al.
patent: 2006/0117779 (2006-06-01), Liebenow
patent: 2006/0144057 (2006-07-01), You et al.
patent: 2007/0062673 (2007-03-01), Olesen
patent: 2008/0043431 (2008-02-01), Marotta et al.
patent: 2010/0134130 (2010-06-01), Lou et al.
patent: 59116022 (1984-07-01), None
patent: 01301499 (1989-12-01), None
Bash Cullen E.
Sharma Ratnesh
Hewlett--Packard Development Company, L.P.
Verbitsky Gail
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