Apparatus, method, and program for measuring optical...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

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Reexamination Certificate

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07046366

ABSTRACT:
To enable measuring optical characteristics of a device under test by overcoming a limit of detection sensitivity caused by detecting light as “wave”. Of an entangled photon pair generated by entangled photon pair generating means20, signal light transmits through a device under test (DUT)10, and idler light transmits through a variable delay line30. The signal light after transmitting through the device under test (DUT)10, and the idler light after transmitting through the variable delay line30are supplied for a semi-transparent mirror40to generate quantum interference. Then, if the timing when photon of the first multiplexed light is detected by a first photon detector50a, and the timing when photon of the second multiplexed light is detected by a second photon detector50bmatch, a multiplier62supplies a pulse, and a counter64counts the pulse. Based on the count, characteristic measuring means70obtains match detection probability, thereby measuring optical parameters of the device under test. Since the measurement uses the quantum interference, it is possible to measure the optical characteristics of the device under test at a high accuracy, and in a wide dynamic range.

REFERENCES:
patent: 6646727 (2003-11-01), Saleh et al.
patent: 6678054 (2004-01-01), Kisner et al.
patent: 6909497 (2005-06-01), Holbrook

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