Apparatus, method, and kit for probing a pattern of points...

Details Apparatus, method, and kit for probing a pattern of points... Apparatus, method, and kit for probing a pattern of points...

2006-12-05

2006-12-05

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010, C324S761010, C439S638000, C439S296000

Reexamination Certificate

active

07145352

ABSTRACT:
An apparatus, method, and kit for probing a pattern of points on a first printed circuit board are disclosed. In one exemplary embodiment, the apparatus includes a probe having i) a plurality of compression interconnects to probe the pattern of points on the first printed circuit board, and ii) a plurality of fixed pins that are electrically coupled to the compression interconnects. The fixed pins extend from the probe opposite the compression interconnects. The apparatus further includes a flexible wire interconnect having first and second sets of electrically coupled connectors, the first set of which is coupled to the fixed pins of the probe. A second printed circuit board has at least one first connector that is electrically coupled to at least one second connector. The at least one first connector is coupled to the second set of connectors of the flexible wire interconnect, and the at least one second connector is configured to couple to a test instrument.

REFERENCES:
patent: 5818248 (1998-10-01), St. Onge
patent: 6194908 (2001-02-01), Wheel et al.
patent: 6359452 (2002-03-01), Mozzetta
patent: 2003/0210067 (2003-11-01), Miller
Brent A. Holcombe, et al., Connector-Less Probe, U.S. Appl. No. 10/373,820, filed Feb. 25, 2003.
Brent A. Holcombe, et al., “Alignment/Retention Device for Connector-Less Probe”, U.S. Appl. No. 10/644,365, filed Aug. 20, 2003.
Brock J. LaMeres, et al., “Backside Attach Probe, Components thereof, and Methods for Making and Using Same”, U.S. Appl. No. 10/902,405, filed Jul. 28, 2004.
Brock J. LaMeres, et al., “Probes with Perpendicularly Disposed Spring Pins, and Methods of Making and Using Same”, U.S. Appl. No. 10/781,086, filed Feb. 17, 2004.
Brock J. LaMeres, et al., “Probe Retention Kit, and System and Method for Probing a Pattern of Points on a Printed Circuit Board”, U.S. Appl. No. 10/918,236 (17 pages of specification including claims and abstract, and five (5) sheets of formal drawings (Figs. 1-10), Filed Aug. 13, 2004.

Affiliated with

Also associated with

Rating

Apparatus, method, and kit for probing a pattern of points... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus, method, and kit for probing a pattern of points..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus, method, and kit for probing a pattern of points... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3673430