Etching a substrate: processes – Nongaseous phase etching of substrate – Using film of etchant between a stationary surface and a...
Patent
1996-10-21
1999-05-25
Dang, Thi
Etching a substrate: processes
Nongaseous phase etching of substrate
Using film of etchant between a stationary surface and a...
438692, 156345, B24B 3700, B24B 700, B24B 100
Patent
active
059067543
ABSTRACT:
An apparatus integrating pad conditioning device (44) with a wafer carrier device (24) for chemical-mechanical polishing applications includes an attaching mechanism (45) for associating conditioning device (44) with wafer carrier device (24). Conditioning surface (84) of conditioning device (44) conditions the polishing pad associates with attaching mechanism (45). Carrier device (24) receives and holds wafer (42) so that wafer (42) and conditioning surface (44) contact the polishing pad (42) to simultaneously condition polishing pad (26) and polish wafer (42).
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Appel Andrew Thorton
Chisholm Michael Francis
Dang Thi
Donaldson Richard L.
Hoel Carlton H.
Texas Instruments Incorporated
Valetti Mark A.
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